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Hedianzixue Yu Tance Jishu/Nuclear Electronics and Detection Technology

ISSN: 0258-0934

IEEE Electromagnetic Compatibility Magazine

ISSN: 2162-2264eISSN: 2162-2272
JUFO Level 1

 IEEE Electromagnetic Compatibility Magazine informs readers of activities in the IEEE EMC Society and educates members via practical technical papers and design tips.

 

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IEEE Instrumentation & Measurement Magazine

ISSN: 1094-6969eISSN: 1941-0123
JUFO Level 1

IEEE Instrumentation & Measurement Magazine is a bimonthly publication. It publishes in February, April, June, August, October, and December of each year. The magazine covers a wide variety of topics in instrumentation, measurement, and systems that measure or instrument equipment or other systems. The magazine has the goal of providing readable introductions and overviews of technology in instrumentation and measurement to a wide engineering audience. It does this through articles, tutorials, columns, and departments. Its goal is to cross disciplines to encourage further research and development in instrumentation and measurement.

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IEEE Sensors Journal

ISSN: 1530-437XeISSN: 1558-1748
JUFO Level 2

According to the IEEE Sensors Council's constitution, "The fields of interest of the Council and its activities shall be the theory, design, fabrication, manufacturing and application of devices for sensing and transducing physical, chemical, and biological phenomena, with emphasis on the electronics and physics aspects of sensors and integrated sensor-actuators." The IEEE Sensors Journal focuses on the numerous sensor technologies spanned by the IEEE, and on emerging sensor technologies.

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IEEE Transactions on Instrumentation and Measurement

ISSN: 0018-9456eISSN: 1557-9662
JUFO Level 3

Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.

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IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control

ISSN: 0885-3010eISSN: 1525-8955
JUFO Level 2

IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control  includes the theory, technology, materials, and applications relating to: (1) the generation, transmission, and detection of ultrasonic waves and related phenomena; (2) medical ultrasound, including hyperthermia, bioeffects, tissue characterization and imaging; (3) ferroelectric, piezoelectric, and piezomagnetic materials, including crystals, polycrystalline solids, films, polymers, and composites; (4) frequency control, timing and time distribution, including crystal oscillators and other means of classical frequency control, and atomic, molecular and laser frequency control standards. Areas of interest range from fundamental studies to the design and/or applications of devices and systems. 

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IEEE/ACM Transactions on Audio, Speech and Language Processing

ISSN: 2329-9290eISSN: 2329-9304
JUFO Level 3

The IEEE/ACM Transactions on Audio, Speech, and Language Processing covers audio, speech and language processing and the sciences that support them. In audio processing: transducers, room acoustics, active sound control, human audition, analysis/synthesis/coding of music, and consumer audio. In speech processing: areas such as speech analysis, synthesis, coding, speech and speaker recognition, speech production and perception, and speech enhancement. In language processing: speech and text analysis, understanding, generation, dialog management, translation, summarization, question answering and document indexing and retrieval, as well as general language modeling.

Indexed in Pubmed® and Medline®, products of the United States National Laboratory of Medicine

Pub Med logo    Medline logo

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ISA Transactions

ISSN: 0019-0578
JUFO Level 2
ISA Transactions is a journal of advances and state-of-the-art in the science and engineering of measurement and automation, of value to leading-edge industrial practitioners and applied researchers.

The topics of measurement include: sensors, perception systems, analyzers, signal processing, filtering, data compression, data rectification, fault detection, inferential measurement, soft sensors, hardware interfacing, etc.; and any of the techniques that support them such as artificial intelligence, fuzzy logic, communication systems, and process analysis. The topics of automation include: statistical and deterministic strategies for discrete event and continuous process control, modelling and simulation, event triggers, scheduling and sequencing, system reliability, quality, maintenance, management, loss prevention, etc.; and any equipment, techniques and best practices that support them such as optimization, learning systems, strategy development, security, and human interfacing and training.

The intended audience is research and development personnel from academe and industry in the field of process instrumentation, systems, and automation.

The journal seeks to bridge the theory and practice gap. This balance of interests requires simplicity of technique, credible demonstration, fundamental grounding, and connectivity to the state of the art in both theory and practice.

If you would like more information please visit the http://www.isa.org/ISA Transactions society homepage

Benefits to authors
We also provide many author benefits, such as free PDFs, a liberal copyright policy, special discounts on Elsevier publications and much more. Please click here for more information on our http://www.elsevier.com/wps/find/authorsview.authors/authorservicesauthor services.

Please see our http://www.elsevier.com/wps/find/journaldescription.cws_home/524244/authorinstructionsGuide for Authors for information on article submission. If you require any further information or help, please visit our support pages: http://support.elsevier.com

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Image Analysis & Stereology

ISSN: 1580-3139eISSN: 1854-5165
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JUFO Level 1

InTech

ISSN: 0192-303X

Information Bulletin on Variable Stars

ISSN: 0374-0676eISSN: 1587-2440
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JUFO Level 1
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Instrumentation Science and Technology

ISSN: 1073-9149eISSN: 1525-6030
JUFO Level 1

Emphasis is on modern instrumental concepts, though not exclusively, including detectors, sensors, data acquisition and processing, instrument control, chromatography, electrochemistry, spectroscopy of all types, electrophoresis, radiometry, relaxation methods, thermal analysis, physical property measurements, surface physics, membrane technology, microcomputer design, chip-based processes, and more. Readership includes everyone who uses instrumental techniques to conduct their research and development. They are chemists (organic, inorganic, physical, analytical, nuclear, quality control) biochemists, biotechnologists, engineers, and physicists in all of the instrumental disciplines mentioned above, in both the laboratory and chemical production environments. The journal is an important resource of instrument design and applications data. The Institute of Scientific Information Journal Citations Report for 2003 ranks Instrumentation Science and Technology 53rd out of 67 journals in Chemistry-Analytical (Science) and 23rd out of 49 journals in Instruments and Instrumentation (Science), with an impact factor of 0.714. Publication office: Taylor & Francis, Inc., 325 Chestnut Street, Suite 800, Philadelphia, PA 19106.

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Instrumentation, Mesure, Métrologie

eISSN: 1631-4670
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Instruments and Experimental Techniques

ISSN: 0020-4412eISSN: 1608-3180
JUFO Level 1

The journal Instruments and Experimental Techniques (Pribory i tekhnika eksperimenta) publishes reviews describing advanced methods for physical measurements and techniques, original papers, and abstracts of preprints that present techniques for physical measurements, principles of operation, design, methods of application, and analysis of the operation of physical instruments used in all fields of experimental physics and when conducting measurements using physical methods and instruments in astronomy, natural sciences, chemistry, biology, medicine, and ecology.

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International Journal of Electrical and Electronic Engineering and Telecommunications

eISSN: 2319-2518

International Journal of Electronics Letters

ISSN: 2168-1724eISSN: 2168-1732

International Journal of Electronics Letters (IJEL) is a world-leading journal dedicated to the rapid dissemination of new concepts and developments across the broad and interdisciplinary field of electronics.

The Journal welcomes submissions on all topics in electronics, with specific emphasis on the following areas:

• power electronics
• embedded systems
• semiconductor devices
• analogue circuits
• digital electronics
• microwave and millimetre-wave techniques
• wireless and optical communications
• sensors
• instrumentation
• medical electronics

Papers should focus on technical applications and developing research at the cutting edge of the discipline. Proposals for special issues are encouraged, and should be discussed with the Editor-in-Chief.

IJEL is a Letters journal and articles over 2500 words in length are only accepted for publication in IJEL’s sister journal International Journal of Electronics. Any submitted article under this length will be automatically transferred to this journal.

All submitted manuscripts are subject to initial appraisal by the Editor-in-Chief, and, if found suitable for further consideration, to rigorous and rapid peer review by independent, anonymous expert referees. All peer review is double blind and submission is online via ScholarOne Manuscripts.

Queries regarding submissions can be made by contacting the Editor-in-Chief, whose decision is final.

Taylor & Francis is a member of the Committee of Publications Ethics (COPE) . Taylor & Francis is committed to peer review integrity and upholding the highest standards of review in our journals. To help us maintain these high standards, we provide guidelines for ethical publishing. Click  here for more details.

 

Taylor & Francis Group acknowledges that the long term preservation of its electronic content is of critical importance and that it has a significant role to play to ensure its content is available and accessible over time. Taylor & Francis Group has an archival strategy in place that provides for the deposit of its electronic source files into an acceptable non-profit third party archive, including Portico and LOCKSS, so that our content will be actively preserved and available in the event it is no longer offered by Taylor & Francis Group or a successor.

We are also participants in the CLOCKSS pilot project. In addition, an agreement with the Dutch National Library has been signed to protect the future of our Online Archive.

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International Journal of Geoinformatics

ISSN: 1686-6576

International Journal of Mass Spectrometry

ISSN: 1387-3806eISSN: 1873-2798
JUFO Level 1

The journal invites papers in all fundamental aspects of mass spectrometry and ion processes, including instrumental developments and applications in biology, chemistry, geology and physics.Benefits to authorsWe also provide many author benefits, such as free PDFs, a liberal copyright policy, special discounts on Elsevier publications and much more. Please click here for more information on our author services.Please see our Guide for Authors for information on article submission. If you require any further information or help, please visit our support pages: http://support.elsevier.com

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International Journal of Optomechatronics

ISSN: 1559-9612eISSN: 1559-9620
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JUFO Level 1

Access the winning Koh Young Best Paper The journal covers various aspects of the fundamental engineering principles of integrating optics/photonics and mechatronics. The aspects include the interaction phenomena between optics and mechatronics, the nature of the integration combining the functions of optical, mechanical, and electronic elements, the functional behavior of the integrated devices and systems, optomechatronic interfaces and embedded characteristics, and the application of optomechatronics to create innovative functionalities for new and advanced systems. Topics covered will include: * adaptive optics * adaptive/tunable optical devices * machine vision/optical imaging * laser optics * optical-based sensors and sensor fusion * optical modulation * vision based micro/nano manipulation * optical systems control * visual motion tracking and control * optics for optomechatronic system design * sensors and actuators * laser processing * optical metrology * fiber optics * optical-based inspection and fault diagnosis * micro opto-electro-mechanical systems * micro/nano components and devices * optical assembly and packaging * optical and vision-based manufacturing, processes, monitoring, and control * optical applications in biosystems, robotic fields, and mechatronic systems Publication office: Taylor & Francis, Inc., 325 Chestnut Street, Suite 800, Philadelphia, PA 19106.

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Internet of Things

ISSN: 2199-1073
JUFO Level 1
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