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IET Radar, Sonar & Navigation

ISSN: 1751-8784eISSN: 1751-8792
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JUFO Level 1

IET Radar, Sonar & Navigation encompasses the theory and practice of systems relating to the processing of signals for radar, radiolocation, radionavigation and surveillance purposes. Examples of the various fields of application include: radar, sonar, electronic warfare, avionic and navigation systems. Processing directed towards the above application areas includes advances in waveform design, adaptive array and super-resolution methods, tracking algorithms, synthetic aperture, and target recognition techniques.

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IET Science, Measurements and Technology

eISSN: 1751-8830
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JUFO Level 1

IET Science, Measurement & Technology publishes papers in science, engineering and technology underpinning electronic and electrical engineering, nanotechnology and medical instrumentation. The key topics covered by IET Science, Measurement & Technology are: • Electromagnetism including electromagnetic theory, computational electromagnetics and EMC • Properties and applications of dielectric, magnetic, magneto-optic, and piezoelectric materials down to the nanometre scale • Measurement and instrumentation including sensors, actuators, medical instrumentation, and fundamentals of measurement including measurement standards, uncertainty, dissemination and calibration

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IET Signal Processing

ISSN: 1751-9675eISSN: 1751-9683
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JUFO Level 1

IET Signal Processing publishes topics such as algorithm advances in single and multi-dimensional, linear and non-linear, recursive and non-recursive digital filters and multi-rate filter banks. It also covers papers on the application of chaos theory, and neural-network-based approaches to signal processing. Topics covered include: • Advances in single and multi-dimensional filter design and implementation • Linear and nonlinear, fixed and adaptive digital filters and multirate filter banks • Statistical signal processing techniques and analysis • Classical, parametric and higher order spectral analysis • Signal transformation and compression techniques, including time-frequency analysis • System modelling and adaptive identification techniques • Machine learning based approaches to signal processing • Bayesian methods for signal processing, including Monte-Carlo Markov-chain and particle filtering techniques • Theory and application of blind and semi-blind signal separation techniques • Signal processing techniques for analysis, enhancement, coding, synthesis and recognition of speech signals • Direction-finding and beam-forming techniques for audio and electromagnetic signals • Analysis techniques for biomedical signals • Baseband signal processing techniques for transmission and reception of communication signals • Signal processing techniques for data hiding and audio watermarking

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IETE Journal of Research

ISSN: 0377-2063eISSN: 0974-780X
JUFO Level 1

IETE Journal of Research is a Bimonthly journal published by the Institution of Electronics and Telecommunication Engineers (IETE), India. It publishes scientific and technical papers describing original research work or novel product/process development. Occasionally special issues are brought out on new and emerging research areas. IETE Journal of Research is useful to researchers, engineers, scientists, teachers, managers and students who are interested in keeping a track of original research and development work being carried out in the broad area of electronics, telecommunications, computer science and engineering and information technology.

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IETE Technical Review

ISSN: 0256-4602eISSN: 0974-5971
JUFO Level 1

The Institution of Electronics and Telecommunication Engineers (IETE) is India's leading recognised professional society devoted to the advancement of Science and Technology of Electronics, Telecommunication & IT. Founded in 1953, it serves more than 69,000 members through various centres, whose number is 58, spread all over India and abroad. The Institution provides leadership in Scientific and Technical areas of direct importance to the national development and economy. Government of India has recognised IETE as a Scientific and Industrial Research Organization (SIRO) and also notified as an educational Institution of national eminence. The objectives of IETE focus on advancing electro-technology. The IETE conducts and sponsors technical meetings, conferences, symposia, and exhibitions all over India, publishes technical journals and provides continuing education as well as career advancement opportunities to its members.

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IPSJ Transactions on System LSI Design Methodology

ISSN: 1882-6687

ISA Transactions

ISSN: 0019-0578
JUFO Level 2
ISA Transactions is a journal of advances and state-of-the-art in the science and engineering of measurement and automation, of value to leading-edge industrial practitioners and applied researchers.

The topics of measurement include: sensors, perception systems, analyzers, signal processing, filtering, data compression, data rectification, fault detection, inferential measurement, soft sensors, hardware interfacing, etc.; and any of the techniques that support them such as artificial intelligence, fuzzy logic, communication systems, and process analysis. The topics of automation include: statistical and deterministic strategies for discrete event and continuous process control, modelling and simulation, event triggers, scheduling and sequencing, system reliability, quality, maintenance, management, loss prevention, etc.; and any equipment, techniques and best practices that support them such as optimization, learning systems, strategy development, security, and human interfacing and training.

The intended audience is research and development personnel from academe and industry in the field of process instrumentation, systems, and automation.

The journal seeks to bridge the theory and practice gap. This balance of interests requires simplicity of technique, credible demonstration, fundamental grounding, and connectivity to the state of the art in both theory and practice.

If you would like more information please visit the http://www.isa.org/ISA Transactions society homepage

Benefits to authors
We also provide many author benefits, such as free PDFs, a liberal copyright policy, special discounts on Elsevier publications and much more. Please click here for more information on our http://www.elsevier.com/wps/find/authorsview.authors/authorservicesauthor services.

Please see our http://www.elsevier.com/wps/find/journaldescription.cws_home/524244/authorinstructionsGuide for Authors for information on article submission. If you require any further information or help, please visit our support pages: http://support.elsevier.com

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ITB Journal of Information and Communication Technology

ISSN: 1978-3086
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ITU News

ISSN: 1020-4148

Image and Vision Computing

ISSN: 0262-8856eISSN: 1872-8138
JUFO Level 2

Image and Vision Computing has as a primary aim the provision of an effective medium of interchange for the results of high quality theoretical and applied research fundamental to all aspects of image interpretation and computer vision. The journal publishes work that proposes new image interpretation and computer vision methodology or addresses the application of such methods to real world scenes. It seeks to strengthen a deeper understanding in the discipline by encouraging the quantitative comparison and performance evaluation of the proposed methodology. The coverage includes: image interpretation, scene modelling, object recognition and tracking, shape analysis, monitoring and surveillance, active vision and robotic systems, SLAM, biologically-inspired computer vision, motion analysis, stereo vision, document image understanding, character and handwritten text recognition, face and gesture recognition, biometrics, vision-based human-computer interaction, human activity and behavior understanding, data fusion from multiple sensor inputs, image databases.In addition to regular manuscripts, Image and Vision Computing Journal solicits manuscripts for the Opinions Column, aimed at initiating a free forum for vision researchers to express their opinions on past, current, or future successes and challenges in research and the community.An opinion paper should be succinct and focused on a particular topic. Addressing multiple related topics is also possible if this helps making the point. While posing questions helps raising awareness about certain issues, ideally, an opinion paper should also suggest a concrete direction how to address the issues. Topics of interest include, but are not limited to:Comments on success and challenges in a (sub-) field of computer vision,Remarks on new frontiers in computer visionObservations on current practices and trends in research, and suggestions for overcoming unsatisfying aspectsObservations on current practices and trends in the community regarding, e.g., reviewing process, organizing conferences, how journals are run, and suggestions for overcoming unsatisfying aspectsReviews of early seminal work that may have fallen out of fashionSummaries of the evolution of one's line of researchRecommendations for educating new generations of vision researchers.The format of an opinion paper should comply with the existing formatting guidelines for the Image and Vision Computing Journal submissions, and should not exceed 2 pages.Months of publication: January/February, March, April, May, June, July/August, September, October, November and December.

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Indonesian Journal of Electrical Engineering and Computer Science

ISSN: 2502-4752eISSN: 2502-4760
JUFO Level 1

Indonesian Journal of Electrical Engineering and Informatics

ISSN: 2089-3272

Infocommunications Journal

ISSN: 2061-2079eISSN: 2061-2125

Informacije MIDEM

ISSN: 0352-9045eISSN: 2232-6979
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JUFO Level 1

Informacinės Technologijos ir Valdymas

ISSN: 1392-124XeISSN: 2335-884X
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JUFO Level 1

Information Display

ISSN: 0362-0972

Infrared and Laser Engineering

ISSN: 1007-2276

Ingegneria Ferroviaria

ISSN: 0020-0956

Integrated Ferroelectrics

ISSN: 1058-4587eISSN: 1607-8489
JUFO Level 1

Integrated Ferroelectrics provides an international, interdisciplinary forum for electronic engineers and physicists as well as process and systems engineers, ceramicists, and chemists who are involved in research, design, development, manufacturing and utilization of integrated ferroelectric devices. Such devices unite ferroelectric films and semiconductor integrated circuit chips. The result is a new family of electronic devices, which combine the unique nonvolatile memory, pyroelectric, piezoelectric, photorefractive, radiation-hard, acoustic and/or dielectric properties of ferroelectric materials with the dynamic memory, logic and/or amplification properties and miniaturization and low-cost advantages of semiconductor i.c. technology.

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Integration

ISSN: 0167-9260
JUFO Level 1

Integration's aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics:Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.Benefits to authorsWe also provide many author benefits, such as free PDFs, a liberal copyright policy, special discounts on Elsevier publications and much more. Please click here for more information on our author services.Please see our Guide for Authors for information on article submission. If you require any further information or help, please visit our support pages: http://support.elsevier.com

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